Quantum Design, Inc.
Automated temperature and magnetic field testing platforms for materials characterization
Quantum Design, Inc.
Quantum Design, Inc. -- attocube Systems PPMS® SPM
Quantum Design, Inc.

attocube Systems PPMS® SPM

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attocube Systems PPMS® SPM

Quantum Design and attocube Systems are proud to announce the PPMS SPM – the only Scanning Probe Microscopes certified and endorsed by Quantum Design for use in its respected Physical Property Measurement System (PPMS). The ultra-compact, high resolution PPMS SPM uses advanced technologies such as low temperature compatible objectives for confocal microscopy or a fiber-optical interferometer for force microscopy with outstanding signal-to-noise force detection.

The rugged housing construction is made from highest quality Titanium, ensuring maximum stability and minimum sample drift during variation of temperature and/or magnetic field. The patented driving technology of the coarse positioning system warrants a precise and reliable sample approach and positioning in three axes with nanometer precision over several millimeters range. Plus, the instrument is fully compatible with commercially available AFM/MFM cantilevers.

PPMS SPM Features

  • Unrivaled performance in the PPMS environment
  • Robust mechanical and electrical design
  • Compatible with the PPMS operating range
    • Temperature: 1.9 K – 400 K
    • Field: ± 16 T
  • Patented positioner technology
  • MFM resolution: Below 20 nm
  • Positioning range: 3 × 3 mm
  • Scanning range: 12 × 12 μm2

 

 

MFM image of NiFe Pads yielding a spatial resolution of 10.7 nm.
MFM image of NiFe Pads
yielding a spatial resolution
of 10.7 nm.
Vortex lattice in Bi-2212 at 4.1 K and 45 Gauss.
Vortex lattice in Bi-2212
at 4.1 K and 45 Gauss.

SHPM image of BaFeO, recorded at 4.2 K.
SHPM image of BaFeO,
recorded at 4.2 K.

Magnetic phase image of perpendicular hard drive media.
Magnetic phase image of
perpendicular hard drive
media.

Microscopy Options

 

attocube Systems PPMS SPM Brochure